AND PROPERTIES, [CRYSTALS--GROWTH, Microscopy Ion Field fachowe i poradniki Książki naukowe Książki i czasopisma Field Ion Microscopy [CRYSTALS--GROWTH, PROPERTIES, AND APPLICATIONS] Nowy oryginalny produkt Field Ion Microscopy [CRYSTALS--GROWTH, PROPERTIES, AND APPLICATIONS] Nowy oryginalny produkt GatTk1296 212zł whiff2da-h8iqqrlv8 celiacosmagazine.com APPLICATIONS] AND PROPERTIES, [CRYSTALS--GROWTH, Microscopy Ion Field APPLICATIONS] AND PROPERTIES, [CRYSTALS--GROWTH, Microscopy Ion Field fachowe i poradniki Książki naukowe Książki i czasopisma Field Ion Microscopy [CRYSTALS--GROWTH, PROPERTIES, AND APPLICATIONS] Nowy oryginalny produkt Field Ion Microscopy [CRYSTALS--GROWTH, PROPERTIES, AND APPLICATIONS] Nowy oryginalny produkt GatTk1296 212zł whiff2da-h8iqqrlv8 celiacosmagazine.com APPLICATIONS] AND PROPERTIES, [CRYSTALS--GROWTH, Microscopy Ion Field APPLICATIONS] AND PROPERTIES, [CRYSTALS--GROWTH, Microscopy

Field Ion Microscopy [CRYSTALS--GROWTH, PROPERTIES, AND APPLICATIONS] Nowy oryginalny produkt

212zł Field Ion Microscopy [CRYSTALS--GROWTH, PROPERTIES, AND APPLICATIONS] | Books & Magazines, Textbooks, Education & Reference, Textbooks Nowy oryginalny produkt Książki i czasopisma,Książki naukowe, fachowe i poradniki celiacosmagazine.com whiff2da-h8iqqrlv8

Field Ion Microscopy [CRYSTALS--GROWTH, PROPERTIES, AND APPLICATIONS] Nowy oryginalny produkt

Ostatnia aktualizacja: 09-10-2021 21:56:31 CEST Wyświetl wszystkie poprawki

Parametry przedmiotu

Stan: Dobry: Książka, która była czytana, ale nadal jest w dobrym stanie. Na okładce widoczne są nieznaczne ślady ... Dowiedz się więcejo stanie przedmiotu ISBN: 9780387117126
EAN: 9780387117126 Series: Crystals, Growth, Properties and Applications Ser.
Publication Year: 1982 Type: Textbook
Format: Hardcover Language: English
Publication Name: Field-Ion Microscopy in Materials Science Author: Richard Zz Wagner
Publisher: Springer Number of Pages: 120 Pages

O tym produkcie

Product Information
Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the surface of a metal. Fifteen years after Milller ) invented the FIM he was also the first to combine the FIM with a time-of-flight (ToF) mass spectrometer - the so-called Atom-Probe FlM - to identify the chemical nature of single atoms imaged in the FIM2). Originally the motivation to develop the ToF atom probe was to use this method to obtain some more fundamental understanding of field ionization and field evaporation, the most basic physical processes in field-ion microscopy. Even after the successful combination of a FIM with a ToF atom probe had been accomplished, the technique was rarely applied to metallurgical investigations since for a fairly long period only refractory metals such as tungsten, molybdenum, iridium, etc. could be imaged in the FIM. How- ever, these metals do not playa very important role in metallurgy. Only when Turner et 3 al. ) substituted the conventional phosphorescent screen of the field-ion microscope with micro-channel electron multiplier arrays, termed micro channel plates, did it become possible to image in the FIM the less refractory metals like Fe, Cu, Ni and even AI.
Product Identifiers
PublisherSpringer
ISBN-100387117121
ISBN-139780387117126
eBay Product ID (ePID)1345016
Product Key Features
AuthorRichard Zz Wagner
Publication NameField-Ion Microscopy in Materials Science
FormatHardcover
LanguageEnglish
SeriesCrystals, Growth, Properties and Applications Ser.
Publication Year1982
TypeTextbook
Number of Pages120 Pages
Additional Product Features
Series Volume NumberVol. 6
Target AudienceCollege Audience
TopicMaterials Science / General, Microscopes & Microscopy
IllustratedYes
GenreTechnology & Engineering, Science